Centre d’Élaboration de Matériaux et d’Etudes Structurales (UPR 8011)

Accueil > Recherche > GNS : Groupe NanoSciences > Physique des surfaces


Non-Contact Atomic Force Microscopy

Staff : Roland Coratger, Sébastien Gauthier, André Gourdon, Olivier Guillermet, Véronique Langlais, David Martrou
Ph.D. students & Postdocs : Bulent Baris, Hassan Khoussa, Mohanad Alchaar

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Room temperature nc-AFM images of the AlN(0001) surface. On the right, the (2x2) structure formed by the N adatoms

Experiments are performed with two types of microscopes working under ultra high vacuum conditions :

- At room temperature, with silicon cantilevers, with the goal of imaging single molecules adsorbed on surfaces of insulators such as KBr(001), SiC(0001) or AlN(0001).

- At low temperature (5 K), with tuning forks (qPlus sensors), with the goal of imaging molecules adsorbed on thin insulating films deposited on metallic surfaces, allowing the simultaneous use of scanning tunneling microscopy or on bulk insulators with nc-AFM alone.

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Calculated (on the left) and experimental (on the right) nc-AFM image of an hexamethylterrylene molecule adsorbed on KBr(001)

These nc-afm experiments can be coupled with Kelvin Probe Force Microscopy (KPFM) measurements to characterize electrostatic surface properties such as dipolar moment or charge distributions of an adsorbate on a metallic or insulating substrate.


Selected publications

  • In-situ NC-AFM measurements of high quality AlN(0001) layers grown at low growth rate on 4H-SiC(0001) and Si(111) substrates using ammonia molecular beam epitaxy. F. Chaumeton, S. Gauthier, D. Martrou, Aip Advances 5, 067108 (2015)
  • nc-AFM Imaging and Manipulation of a Triphenylene Derivative on KBr(001), V. Langlais, O. Guillermet, D. Martrou, A. Gourdon, S. Gauthier, J. Phys. Chem. C 120, 18151 (2015)
  • Noncontact atomic force microscopy and density functional theory studies of the (2×2) reconstructions of the polar AlN(0001) surface, Physical Review B, F. Chaumeton, R. Robles, M. Pruneda, N. Lorente, B. Eydoux, X. Bouju, S. Gauthier, and D. Martrou, Physical Review B 94, 165305 (2016



  • Image NC-AFM à résolution moléculaire
    Image NC-AFM à résolution moléculaire
  • Image NC-AFM à hauteur constante
    Image NC-AFM à hauteur constante
  • Image NC-AFM à décalage de fréquence constant
    Image NC-AFM à décalage de fréquence constant