Centre d’Élaboration de Matériaux et d’Etudes Structurales (UPR 8011)


Accueil > Services > Atom-Tech & Procédés > Microscopies à sonde locale

Near-field microscopy service

The near-field microscopy service brings together a set of near-field surface imaging techniques. Based on 2 Bruker commercial microscopes (one of the two has a nano-positioning stage and is installed in a clean room), the service offers access to different kinds of measurements :

  • Topography (contact or tapping mode AFM, STM) in air or liquid
  • Lateral force microscopy (LFM)
  • Magnetic force micrscopy (MFM)
  • Electric force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)
  • Piezoresponse force microscopy (PFM)
  • Force curves

Near-field microscopies allow 3D imaging, from 1 nm to 100 µm scale, on all types of samples : surfaces (metallic, insulating or semi-conductive), molecules, biological samples…

 

Person in charge of carrying out the measurements :

  • By the person in charge of the service, in the presence or not of the applicant
  • By the applicant after a training period (to be considered for large measurement campaigns)

 

Sample physical requirements (for the microscope with the best resolution) :

  • The useful area to be observed must be located in the center of the sample, in an area of approximately 5x5 mm². The total dimensions of the sample must not exceed 1 cm (W) x 1 cm (L) x 0.8 cm (T)
  • The sample can however be very small and in any shape

 

Booking :

  • Contact the head of service (contact below)
  • For applicants already trained, reservations on GRR via the CEMES intranet site

 

Terms of access :

  • The service is opened in priority to members of the laboratory
  • The service is also open to external people, institutions or companies

 

Rate : full-cost per half a day

  • Academic clients : € 30.35 to 99.53, depending on the source of funding
  • Other clients : € 727.77

 

Contact : Grégory Seine, head of service, +33 562 257 964, seine [at] cemes.fr