Centre d’Élaboration de Matériaux et d’Etudes Structurales (UPR 8011)


Accueil > Recherche > M3 : Matériaux Multi-échelles Multifonctionnels > Carbones nanostructurés > Dispositifs, applications et démonstrateurs

On-Chip NanoLab

One problem with regular FET device configuration is that characterizing the contacted carbon nanoform by TEM is no longer possible. We thus decided to develop an "in-TEM, on-chip nanolab", in collaboration with Néel-Grenoble and LNCMI-Toulouse, consisting in small chips partly electron-transparent enabling to probe properties (e.g., transport) of a unique nano-object under various constraints (e.g., mechanical, thermal…).

One problem with regular FET device configuration is that characterizing the contacted carbon nanoform by TEM is no longer possible. We thus decided to develop an "in-TEM, on-chip nanolab", in collaboration with Néel-Grenoble and LNCMI-Toulouse, consisting in small chips partly electron-transparent enabling to probe properties (e.g., transport) of a unique nano-object under various constraints (e.g., mechanical, thermal…). Those chips are able to be mounted onto a home-designed multi-connects (19) TEM sample-holder, and also onto holders designed for others instruments (e.g., Raman spectrometer, near-field microscopy) and various environments (low pressure, reactive atmosphere, high magnetic field, near-0 K temperature). Dynamic recording of the carbon nanoform structure and property evolution upon various constrains will therefore be possible in a close future.