Centre d’Élaboration de Matériaux et d’Etudes Structurales (UPR 8011)


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Opening of the nano-X platform

par Evelyne Prevots - publié le

The nano-X platform is a tool dedicated to the characterization of nanomaterials using X-ray scattering and diffraction techniques. The platform is accessible to physicists, chemists, materials scientists and industrial partners.

This project is supported CEMES, CIRIMAT, LCC and LPCNO, who aim to maintain and develop X-ray techniques at a competitive level.

The equipments of the nano-X platform are distributed in the different partners sites as follow :

  • Laboratoire de chimie de coordination
    • Diffractometer Nonius equipped with a four circle goniometer (kappa geometry), a CCD BRUKER APEX II camera, and a Mo X-ray sealed tube. It is accompanied with a low temperature measurement system using liquid nitrogen : Cryostream (Oxford Cryosystem) allowing to reach 100 K.

 

  • Centre Interuniversitaire de Recherche et Ingénierie des Matériaux
    • Diffractometer Bruker D8 Advance
      Source : anticathode Cu, programmable divergence slits, 1D detector Vantec. Sample charger (9 positions). A high temperature chamber is available (up to 1200°C).

 

  • Laboratoire de physique chimie des nano-objets
    • Diffractometer Panalytical Empyrean
      Source : anticathode Co, programmable divergence slits, Bragg-Brentano or Debye-Sherrer geometry, point detector or linear detector Xcelerator, high temperature measurements (up to 1200°C), possiblity to measure air-sensitive specimen, spinner.
      For thin film applications, hybrid primary optics (mirror + channel-cut Ge 220 monochromator), chi-phi-z stage.
    • Diffractomètre Panalytical Empyrean
      Source : anticathode Co, primary optic Bragg Brentano HD, linear detector PiXcel, possibility to measure under agressive atmosphere (H2, CO)

 

  • Centre d’élaboration de matériaux et d’études structurales
    • Diffractometer Bruker D8 Advance
      Source : anticathode Cu, primary optics : monocap to define a 100µm beam size, XYZ sample positioning stage, linear detector.
    • Diffractometer Bruker D8 Discover dedicated to strain and texture determination
      Source : microsource Co, collimator set in order to define a beam size between 50 and 500µm, Chi-phi-XYZ sample positioning stage, 2D detector.
    • Wide angle X-Ray scattering measurement device
      Source : anticathode Mo, Debye Sherrer geometry, SDD detector with high energy resolution.
JPEG - 34.9 ko
D8 Discover pour la mesure de contraintes et textures
© CEMES-CNRS

The nano-X project is co-funded by :

 

Contact

nicolas.ratel-ramond chez cemes.fr