Centre d’Élaboration de Matériaux et d’Etudes Structurales (UPR 8011)


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Séminaire John Flynn

Carl ZEISS Microscopy

John Flynn
Carl ZEISS Microscopy
John.Flynn chez zeiss.com

 

Sub-micron and nano 3 & 4D imaging X-ray microscopy

Abstract : X-ray microscopy has taken the technology of the synchrotron into the laboratory and from its introduction in 2006 continues to develop with many new capabilities. The aim of the talk will be to give an overview of the technology for sub-micron and nano 3 & 4D imaging. Describing the latest developments and applications for nano in situ load stages, DCT for grain mapping and how correlative imaging plays an ever increasing role in materials research.

 

Contact : marc.legros chez cemes.fr