News
2004-01-01:
Native OS X version in progress
Native OS X version in progress
2002-11-15:
First public version available for download
First public version available for download
Links
- References
- Other softwares
- EELS Database
About Epsilon
Calculation of the real and imaginary
parts of the dielectric function based
on data recovered from the low-energy-loss
range of the EEL spectrum.
EPSILON is a software tool with the aid of which most quantitative operations on the
various parts of the electron energy-loss spectrum can be performed:
- quantitative elemental analysis
- deconvolution of the multiple-scattering events and of the transfer function
- extraction of the characteristic distributions corresponding to core-level electron excitations
- application of an algorithm for the treatment of the EXELFS signal (RDF)
- simulation of the fine structure of ELNES and EXELFS distributions using the FEFF algorithm
- calculation of the dielectric function and the related optical parameters from the low-loss range of the EEL spectrum (VEELS: Valence Electron Energy Loss Spectroscopy)
- simulation of spectra with the aid of Drude functions, from which the parameter t/lambda can be evaluated.
- modelling of curves in terms of mathematical functions,
- operations based on the Fourier transform (smoothing, convolution, self-correlation, cross-correlation, etc ...)
- certain mathematical operations (normalization, differentiation, multiplication, addition, etc ...).
The software is very user-friendly, dialogue being via a graphics interface with 20 windows, pull-down menus and a toolbar giving easy access to certain functions. The use of the software can be faciltated by consulting help balloons.
The calculation of the dielectric function is a new EELS tool we propose in the public domain version of EPSILON. It is described in detail in the documentation. The other EELS operations and data-handling tools are more classical and already often used.
Click here to download the full documentation (PDF).System requirements:
EPSILON runs on Macintosh computers (Mac OS > 8.x, Mac OS X running Classic, 3 Mbytes disk space and 5 Mbytes memory minimum).Click here to download EPSILON.
References:
- "Study of the dielectric properties near the bandgap by VEELS: gap measurement in bulk materials"
S. Schamm, G. Zanchi, Ultramicroscopy 96 (3-4)(2003) 559-564
http://dx.doi.org/10.1016/S0304-3991(03)00116-5 - "Contamination and the quantitative exploitation of the EELS low-loss experiments"
S. Schamm, G. Zanchi
http://dx.doi.org/10.1016/S0304-3991(01)00070-5 - "V.U.V absorption coefficient measurements of borate matrices"
B. Moine, J. Mugnier, D. Boyer, R. Mahiou, S. Schamm, G. Zanchi
http://dx.doi.org/10.1016/S0925-8388(01)01151-3
Other Softwares:
- C. Walsh, PEELS program (free),
Cavendish laboratory,Madingley road, Cambridge, England - R.H. French
http://www.lrsm.upenn.edu/~frenchrh/veels_software.htm - GATAN
http://www.gatan.com
Click to enlarge
