Hydrogen implantation-induced defects in bulk Si studied by
Raman spectrometry.
C. Villeneuve, V. Paillard, K. Bourdelle, I. Cayefourcq, A. Boussagol,
M. Kennard.
Nuclear Instr. and Meth. B, 253, 182-186 (2006).
Characterization of few-nanocrystals electronic devices by photoluminescence
imaging.
A. Arbouet, M. Carrada, F. Demangeot, V. Paillard, G. BenAssayag,
C. Bonafos, A. Claverie, S. Schamm, C. Dumas, J. Grisolia, M.A.F.
Van den Boogaart, J. Brugger, L. Doeswijk.
J. Luminescence 121, 340-343 (2006).
Electron-acoustic phonon interaction and resonant Raman scattering
in Ge quantum dots: matrix and quantum confinement effects.
J-R. Huntzinger, A. Mlayah, V. Paillard, A. Wellner, N. Combe,
C. Bonafos.
Phys. Rev. B 74, 115308 (2006).
Experimental study of LO phonons and excitons in ZnO nanoparticles
produced by room-temperature organometallic synthesis.
F. Demangeot, V. Paillard, P. M. Chassaing, C. Pages, M. L. Kahn,
A. Maisonnat, B. Chaudret.
Appl. Phys. Lett. 88, 071921 (2006).
Photoluminescence of Si nanocrystal memory devices obtained by
ion beam synthesis.
M. Carrada, A. Wellner, V. Paillard, C. Bonafos, H. Coffin, A.
Claverie.
Appl. Phys. Lett. 87, 251911-251913 (2005).
Engineering Strained Silicon On Insulator wafers with the Smart-CutTM
technology.
B. Ghyselen et al.
Solid State Electron. 48, 1285-1296 (2004).
Stress measurement and modeling in silica-embedded germanium
nanocrystals.
A. Wellner, V. Paillard, C. Bonafos, H. Coffin, A. Claverie, B.
Schmidt, K. H. Heinig.
J. Appl. Phys., 94, 5639-5642 (2003).
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