"Scattering-type scanning near-field optical microscopy: spectroscopic imaging with spatial resolution below the diffraction limit."
Jean-Marie Poumirol
CEMES CNRS
Infrared optical spectroscopy is one of the most informative methods in advanced materials research, unfortunately the large wavelength of the light strongly limits the spatial resolution. Scattering-type scanning near-field optical microscopy provides access to super-resolution spectroscopic imaging of the surfaces of a variety of materials and nanostructures [1]. It allows ultrabroadband optical (0.5–3000 μm) nano-imaging, and nanospectroscopy with fine spatial (<10 nm), spectral (<1 cm−1) [2], and temporal (<10 fs) resolution [3]. In this talk I will introduce s-SNOM working principles and present recent advances which broaden the horizons in novel material research [4] by providing new opportunities to study electromagnetic (EM) mode dispersion, light-matter interaction, and electron-lattice correlation at nanoscale resolutions, which conventional microscopy techniques, such as phase contrast microscopy, differential interference contrast microscopy, and laser scanning confocal microscopy, fail to easily achieve.
[1] T. Taubner, R. Hillenbrand, F. Keilmann, J. Microsc. 2003, 210, 311.
[2] P. Hermann, et.al., Opt. Express 2014, 22, 17948.
[3] M. Wagner, et. al., Nano Lett. 2014, 14, 894.
[4] F. Hu, Y. Luan, et.al., Nat. Photonics 2017, 11, 356.
Welcome coffee will be served in the hall from 10:30 am.