The local probe microscopy service brings together a set of near-field surface imaging techniques. Based on 2 Bruker commercial microscopes (one of the two has a nano-positioning stage and is installed in a clean room), the service offers access to different kinds of measurements:
- Topography (contact or tapping mode AFM, STM) in air or liquid
- Lateral force microscopy (LFM)
- Magnetic force micrscopy (MFM)
- Electric force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
- Piezoresponse force microscopy (PFM)
- Force curves
Near-field microscopies allow 3D imaging, from 1 nm to 100 µm scale, on all types of samples: surfaces (metallic, insulating or semi-conductive), molecules, biological samples…
The service also acquired a Bruker Dektak 150 contact profilometer, which is located in a clean room close to the nanofabrication process and is ideal for quickly measuring the profile of a surface in order to determine its roughness or geometry on a micro- or nanoscale.
Person in charge of carrying out the measurements:
- By the person in charge of the service, in the presence or not of the applicant
- By the applicant after a training period (to be considered for large measurement campaigns)
Sample physical requirements (for the microscope with the best resolution):
- The useful area to be observed must be located in the center of the sample, in an area of approximately 5x5 mm². The total dimensions of the sample must not exceed 1 cm (W) x 1 cm (L) x 0.8 cm (T)
- The sample can however be very small and in any shape
Booking:
- Contact the head of service (contact below)
- For applicants already trained, reservations on GRR via the CEMES intranet site
Terms of access:
- The service is opened in priority to members of the laboratory
- The service is also open to external people, institutions or companies
Rate: full-cost per half a day
- Academic clients: € 30.35 to 99.53, depending on the source of funding
- Other clients: € 727.77
Contact: Grégory Seine, head of service, +33 562 257 964, seine [at] cemes.fr