Acquired in the frame of the nano-X platform, the configuration of this equipment is unique in France. Equipped with a high brilliance microsource with Co anticathode and a 2D detector, this equipment allows texture and stress measurements with a beam size within the range of 1mm down to 50µm, and with optimized acquisition time.
This equipment was founded by the Labex NEXT, Université Paul Sabatier, and Université Fédérale Toulouse Midi-Pyrénées.
Contact
nicolas.ratel-ramond chez cemes.fr